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INTRODUCTION

Cryogenic electron microscope (Cryo-EM) is an electronic instrument used to examine the three-dimensional (3D) structures of biological macromolecules at cryogenic temperatures. The Cryo-EM is primarily being researched for the structural analysis of small proteins, enhancement of protein resolution, and the integration between Cryo-EM and drug research

The earlier forms of electron microscopes made it impossible to study the biomolecules in 3D form as the powerful beams often destroyed the biological matter. Cryo-Electron Microscopy has overcome several barriers, resulting in a new age in biochemistry.

Top Companies
Patent Filling
Notable Patents

Title: Cryo station system

JP6312811B2

 

Assignee: Hitachi Tech 

The invention relates to handling of a sample for
observation with an electron microscope. A technique
for storing & moving a cooled sample without causing
condensation or frost.

Title: Electronic imaging detector with thermal conduction layer

US20210193848A1

 

Assignee: Gatan Inc

The invention relates to solid state active pixel image
silicon sensor for direct back-illuminated exposure to
an electron beam. The use of silicon as the sensor
substrate minimizes the scatter of electrons.

Title: Ablating material for an object in a particle beam device

US9782805B2

 

Assignee: Carl Zeiss AG

 

The invention relates to a method for ablating a material from a material unit and for arranging the material on an object (sample) arranged in an electron microscope

Title: Method for reducing or
removing organic & inorganic
contamination from a vacuum
system of imaging & analytical devices & a device for carrying it out.

US9782805B2

 

Assignee: Tescan Orsay Holding AS 

 

The present invention utilizes an incredibly low temperature to undercool a surface covered in a photocatalytic layer so that it can be used for decontamination.

Title: A mems device for
transmission microscopy, & a
method

WO2022075841A2

 

Assignee: Bruker Neder

 

The invention relates to a MEMS device that allows for holding a sample under vacuum in particular for cryoelectron microscopy, wherein a liquid sample is frozen into a vitreous state

Title: Charged Particle Beam
Apparatus

US20220189731A1

 

Assignee: JEOL LTD

 

The present invention relates to a charged particle beam instrument. A specimen is inserted into a specimen
chamber of the instrument such as transmission electron microscope where it is viewed and examined.

Latest Tech - Research

Research Institute
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Researchers from China have developed a method to use ultra-flat graphene (UFG)
as the support for Cryo-EM specimen preparation to achieve better control of
vitreous ice thickness. The homogeneity of ice thickness is a key factor to ensure high
image quality

Physicists from TU Delft have developed a 3-in-1 microscope where a light beam, electron beam and ion beam work together to precisely cut out specific slices from biological samples

Scientists at Martin Luther University Halle-Wittenberg (MLU) & the European
Molecular Biology Laboratory in Hamburg have developed a novel AI-based method to analyze Cryo-electron microscopy
data.

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