INTRODUCTION
Cryogenic electron microscope (Cryo-EM) is an electronic instrument used to examine the three-dimensional (3D) structures of biological macromolecules at cryogenic temperatures. The Cryo-EM is primarily being researched for the structural analysis of small proteins, enhancement of protein resolution, and the integration between Cryo-EM and drug research
The earlier forms of electron microscopes made it impossible to study the biomolecules in 3D form as the powerful beams often destroyed the biological matter. Cryo-Electron Microscopy has overcome several barriers, resulting in a new age in biochemistry.
Title: Cryo station system
JP6312811B2
Assignee: Hitachi Tech
The invention relates to handling of a sample for
observation with an electron microscope. A technique
for storing & moving a cooled sample without causing
condensation or frost.
Title: Electronic imaging detector with thermal conduction layer
US20210193848A1
Assignee: Gatan Inc
The invention relates to solid state active pixel image
silicon sensor for direct back-illuminated exposure to
an electron beam. The use of silicon as the sensor
substrate minimizes the scatter of electrons.
Title: Ablating material for an object in a particle beam device
US9782805B2
Assignee: Carl Zeiss AG
The invention relates to a method for ablating a material from a material unit and for arranging the material on an object (sample) arranged in an electron microscope
Title: Method for reducing or
removing organic & inorganic
contamination from a vacuum
system of imaging & analytical devices & a device for carrying it out.
US9782805B2
Assignee: Tescan Orsay Holding AS
The present invention utilizes an incredibly low temperature to undercool a surface covered in a photocatalytic layer so that it can be used for decontamination.
Title: A mems device for
transmission microscopy, & a
method
WO2022075841A2
Assignee: Bruker Neder
The invention relates to a MEMS device that allows for holding a sample under vacuum in particular for cryoelectron microscopy, wherein a liquid sample is frozen into a vitreous state
Title: Charged Particle Beam
Apparatus
US20220189731A1
Assignee: JEOL LTD
The present invention relates to a charged particle beam instrument. A specimen is inserted into a specimen
chamber of the instrument such as transmission electron microscope where it is viewed and examined.
Latest Tech - Research
Researchers from China have developed a method to use ultra-flat graphene (UFG)
as the support for Cryo-EM specimen preparation to achieve better control of
vitreous ice thickness. The homogeneity of ice thickness is a key factor to ensure high
image quality
Physicists from TU Delft have developed a 3-in-1 microscope where a light beam, electron beam and ion beam work together to precisely cut out specific slices from biological samples
Scientists at Martin Luther University Halle-Wittenberg (MLU) & the European
Molecular Biology Laboratory in Hamburg have developed a novel AI-based method to analyze Cryo-electron microscopy
data.
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